| CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Imaging of the Al Structure of an Ultrathin Alumina Film Grown on Cu-9 at.%Al(111) by STM |
| ZHANG Yun1,2, YU Ying-Hui1**, SHE Li-Min1,2, QIN Zhi-Hui1, CAO Geng-Yu1
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1State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Wuhan Institute of Physics and Mathematics, Chinese Academy of Sciences, Wuhan 430071
2Graduate School of the Chinese Academy of Sciences, Beijing 100049
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| Cite this article: |
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ZHANG Yun, YU Ying-Hui, SHE Li-Min et al 2011 Chin. Phys. Lett. 28 066802 |
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Abstract An ultrathin alumina film grown on a Cu-9 at.%Al(111) substrate is investigated using low-temperature scanning tunneling microscopy and spectroscopy. The topographic images show a zigzagged corrugation characterized by the heptagonal and pentagonal organization of interfacial aluminum atoms and by a dependence on the bias voltage. Furthermore, the dI/dV maps and the spectrum reveal an unoccupied state locating at about +0.26 eV, which most likely originates from the aluminum-oxygen hybridization and is possibly responsible for the heptagonal and pentagonal arrangements of Al atoms.
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| Keywords:
68.35.B-
73.61.Ng
68.37.Ef
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Received: 19 October 2010
Published: 29 May 2011
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| PACS: |
68.35.B-
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(Structure of clean surfaces (and surface reconstruction))
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73.61.Ng
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(Insulators)
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68.37.Ef
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(Scanning tunneling microscopy (including chemistry induced with STM))
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