| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Simulation of Light Intensification Induced by Defects of Polished Fused Silica |
| WANG Feng-Rui1, LIU Hong-Jie1, HUANG Jin1, ZHOU Xin-Da1, JIANG Xiao-Dong1**, WU Wei-Dong1, ZHENG Wan-Guo1, JU Xin2
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1Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900
2Department of Physics, University of Science and Technology Beijing, Beijing 100083
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| Cite this article: |
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WANG Feng-Rui, LIU Hong-Jie, HUANG Jin et al 2011 Chin. Phys. Lett. 28 014206 |
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Abstract Light intensity distribution in the vicinity of inclusions and etched cracks in polished fused silica at wavelength scale are simulated by using the finite-difference time-domain algorithm. Light intensity enhancement factor as functions of diameter and refractive index of inclusions are investigated, more than 10 times that of incident beam is obtained in the simulation. We model the etched crack in close proximity to a real structure, which is characterized by AFM. We find that the peak light intensity of the crack is a function of its cross sectional breadth depth ratio, providing good hints for the effective processing of fused silica samples to improve the damage threshold.
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| Keywords:
42.50.Wk
42.25.Dd
42.25.Hz
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Received: 05 November 2010
Published: 23 December 2010
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| PACS: |
42.50.Wk
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(Mechanical effects of light on material media, microstructures and particles)
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42.25.Dd
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(Wave propagation in random media)
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42.25.Hz
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(Interference)
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[1] Neauport J, Lamaignere L, Bercegol H, Pilon F and Birolleau J C 2005 Opt. Express 13 10163
[2] Bloenbergen N 1973 Appl. Opt. 12 661
[3] Ge'nin F Y, Salleo A and Pistor T V 2001 J. Opt. Soc. Am. A 18 2607
[4] Wang Y, Xu Q, Chai L Q, Chen N and Zhu X Q 2005 High Power Laser and Particle Beams 17 67 (in Chinese)
[5] Hamza A V, Siekhaus W J, Rubenchik A M, Feit M and Chase L L 2002 Proc. SPIE 4679 96
[6] Papernov S and Schmid A W 2002 J. Appl. Phys. 92 5720
[7] Bonneau F, Combis P, Rullier J L and Vierne J 2002 J. Appl. Phys. B 75 803
[8] Ge'nin F Y, Kozloski M R and Feit M D 1998 LLNL Report UCRL-ID-0130003 1
[9] Stolz C J, Hafeman S and Pistor T V 2008 Appl. Opt. 47 C162
[10] Stolz C J, Feit M D and Pistor T V 2006 Appl. Opt. 45 1596
[11] Dai F X, Shen M and Zhang Y D 2007 Proc. SPIE 6722 67221S-1
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