Chin. Phys. Lett.  2010, Vol. 27 Issue (10): 108103    DOI: 10.1088/0256-307X/27/10/108103
CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
Effects of Substrate Temperature and Vacuum Annealing on Properties of ITO Films Prepared by Radio-Frquency Magnetron Sputtering
N. Boonyopakorn1, N. Sripongpun1, C. Thanachayanont2, S. Dangtip1,3
1Department of Physics, Mahidol University, Bangkok 10400, Thailand
2National Metal and Materials Technology, Klongluang, Prathumthani 10120, Thailand
3Center for Nanoscience and Nanotechnology, Mahidol University, Bangkok 10400, Thailand
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N. Boonyopakorn, N. Sripongpun, C. Thanachayanont et al  2010 Chin. Phys. Lett. 27 108103
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Abstract Indium tin oxide (ITO) films were prepared by rf magnetron sputtering under two conditions: (i) at substrate temperature Ts from room temperature (RT) to 350°C, (ii) with additional post−annealing in vacuum at 400°C for 30 min in comparison of their crystalline structures, and electrical−optical properties of the films deposited. From the experimental results, it is found that, under the first condition, the crystalline structures and the electrical-optical properties of the films are improved with the increasing Ts. Under the other condition, i.e. with the additional post−annealing, the films exhibit higher degree of crystallinities and better electrical-optical properties. Under the two deposition conditions, inter-relation between electrical-optical properties and the crystalline structure is observed clearly. However, even under the same annealing condition, it is observed that improved properties of the films are different, depending on their deposition temperatures, which implies that an initial stage of the ITO film before annealing is an important factor for the film's properties improved after annealing. The resistivity of 2.33×10-4 Ω⋅cm can be achieved at Ts of 350°C after annealing.
Keywords: 81.15.-z      81.40.-z     
Received: 14 December 2009      Published: 26 September 2010
PACS:  81.15.-z (Methods of deposition of films and coatings; film growth and epitaxy)  
  81.40.-z (Treatment of materials and its effects on microstructure, nanostructure, And properties)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/27/10/108103       OR      https://cpl.iphy.ac.cn/Y2010/V27/I10/108103
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N. Boonyopakorn
N. Sripongpun
C. Thanachayanont
S. Dangtip
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