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Modification of AFM Tips for Facilitating Picking-up of Nanoparticles |
| WANG Peng1,3, YANG Hai-Jun1,3, WANG Hua-Bin1,3, LI Hai1, WANG Xin-Yan1,3, WANG Ying1, LÜ Jun-Hong1 , LI Bin1, ZHANG Yi1, HU Jun1,2 |
| 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 2018002Bio-X Life Science Research Center, College of Life Science and Biotechnology, Shanghai Jiao Tong University, Shanghai 2002403Graduate School of the Chinese Academy of Sciences, Beijing 100049 |
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| Cite this article: |
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WANG Peng, YANG Hai-Jun, WANG Hua-Bin et al 2008 Chin. Phys. Lett. 25 2407-2409 |
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Abstract The radius of atomic force microscope (AFM) tip is a key factor that influences nonspecific interactions between AFM tip and nanoparticles. Generally, a tip with larger radius contributes to a higher efficiency of picking up nanoparticles. We provide two methods for modifying the AFM tip: one is to wear a tip apex on a solid substrate and the other is to coat a tip with poly (dimethylsiloxane) (PDMS). Both the approaches can enhance the adhesion force between the tip and nanoparticles by increasing tip radius. The experimental results show that a modified tip, compared to an unmodified one, achieves six-fold efficiency improvement in the capture of targeted colloidal gold nanoparticles.
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| Keywords:
07.79.Lh
81.07.Lk
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Received: 02 January 2008
Published: 26 June 2008
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