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Avalanche Phenomenon of Superthermal Electrons Measured by SDD with New SPHA during ECRH |
YANG Jin-Wei1;ZHANG Yi-Po1;LIAO Min1;HU Li-Qun2;LI Xu1;SONG Xian-Ying1;LIN Shi-Yao2;LI Yong-Ge1;LUO Cui-Wen1;CHEN Liao-Yuan1;RAO Jun1;YANG Qing-Wei1 |
1Southwestern Institute of Physics, PO Box 432, Chengdu 6100412Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031 |
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Cite this article: |
YANG Jin-Wei, ZHANG Yi-Po, LIAO Min et al 2008 Chin. Phys. Lett. 25 1022-1025 |
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Abstract Two high performance silicon drift detectors (SDD) are installed at the equatorial port with z=0 and z= -16.4cm on HL-2A tokamak, respectively. These SDDs combine with the new and non-conventional software pulse height analyser (SPHA) successfully developed more recently by us to measure the time evolution of soft x-rays spectra, the thermal and superthermal electron temperatures. The high-quality three-dimensional figure of time evolution for soft x-rays energy spectra is easily obtained by combination of a new SPHA and computer. Therefore, the measurement accuracies and the time resolutions of thermal and superthermal electron temperatures are also improved. The enhancement phenomenon of superthermal electron during electron cyclotron resonance heating (ECRH) can be explained by the combination of superthermal electron avalanche theory and experimental parameters.
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Keywords:
52.50.Sw
52.70.La
52.70.-m
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Received: 25 September 2007
Published: 27 February 2008
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PACS: |
52.50.Sw
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(Plasma heating by microwaves; ECR, LH, collisional heating)
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52.70.La
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(X-ray and γ-ray measurements)
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52.70.-m
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(Plasma diagnostic techniques and instrumentation)
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