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Cleavage Luminescence from Cleaved Indium Phosphide |
LI Dong-Guang |
Edith Cowan University, 2 Bradford Street, Mt Lawley, WA 6050, Australia |
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Cite this article: |
LI Dong-Guang 2008 Chin. Phys. Lett. 25 4371-4374 |
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Abstract We outline the experiments performed to gain further information about the structure and properties of cleaved InP surfaces. The experiments involved detecting the luminescence produced after cleaving thin InP plates within a high vacuum, by a process of converting the luminescence to an electrical signal which could be amplified and measured accurately. The experimental results show that the detected luminescence durations from cleaved InP are usually only about 10μs. It is believed that this time represents the time of travel of the crack with the actual recombination time being much shorter. Strong signals could also be picked up from cleaved InP in air.
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Keywords:
71.23.An
71.55.Eq
73.20.At
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Received: 12 September 2008
Published: 27 November 2008
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PACS: |
71.23.An
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(Theories and models; localized states)
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71.55.Eq
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(III-V semiconductors)
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73.20.At
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(Surface states, band structure, electron density of states)
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[1] Li W and Haneman D 1999 J. Chem. Phys. 11110314 [2] Haneman D and McAlpine N S 1991 Phys. Rev. Lett. 6 758 [3] Li D G 2007 Surf. Rev. Lett. 14 101 [4] Ebert P, Cox G, Poppe U and Urban K 1992 Surf. Sci. 271 587 [5] Chadi D J 1979 Phys. Rev. B 19 2074 [6] Mailhiot C, Duke C B and Chadi D J 1985 Surf. Sci. 149 366 [7] Carstensen H, Claessen R, Manzke R and Skibowski M 1990 Phys. Rev. B 41 9880 |
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