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Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle |
| LI Zhao-Xia 1,2;ZHANG Li-Juan 1,2;YI Hou-Hui 1,2;FANG Hai-Ping1 |
| 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, PO Box 800-204, Shanghai 2018002Graduate School of the Chinese Academy of Sciences, Beijing 100080 |
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| Cite this article: |
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LI Zhao-Xia, ZHANG Li-Juan, YI Hou-Hui et al 2007 Chin. Phys. Lett. 24 2289-2292 |
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Abstract Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope (AFM) tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and
results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.
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| Keywords:
47.55.Dr
68.08.-p
68.03.Cd
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Received: 28 January 2007
Published: 25 July 2007
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| PACS: |
47.55.dr
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(Interactions with surfaces)
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68.08.-p
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(Liquid-solid interfaces)
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68.03.Cd
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(Surface tension and related phenomena)
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