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Simplified Model for Analysing Ion/Photoelectron Images |
| ZHU Jing-Yi1,2;WANG Bing-Xing1,2;GUO Wei1,2;WANG Yan-Qiu1;WANG Li1 |
| 1State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Dalian 1160232Graduate School of the Chinese Academy of Sciences, Beijing100039 |
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| Cite this article: |
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ZHU Jing-Yi, WANG Bing-Xing, GUO Wei et al 2007 Chin. Phys. Lett. 24 1922-1925 |
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Abstract Based on the Onion--Peeling algorithm (OPA) principle, we present a simplified model for analysing photoion and photoelectron images, which allows the analysis of experimental raw images. A three-dimensional distribution of the nascent charged particles, from which the radial and angular distributions are deduced, can be obtained more easily by this model than by the commonly used procedures. The analysis results of Xe photoelectron images by this model are compared with those from the standard Hankel--Abel inversion. The results imply that this model can be used for complicated (many peaks) and `difficult' (low signal-to-noise) images with cylindrical symmetries, and can provide a reliable reconstruction in some cases when the commonly used Hankel Abel transform method fails.
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| Keywords:
39.90.+d
32.80.Rm
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Received: 15 March 2007
Published: 25 June 2007
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| PACS: |
39.90.+d
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32.80.Rm
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(Multiphoton ionization and excitation to highly excited states)
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