| Original Articles |
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High-Sensitivity Sensor Based on Surface Plasmon Resonance Enhanced Lateral Optical Beam Displacements |
| YANG Xiao-Yan1;LIU De-Ming1;XIE Wen-Chong2;LI Chun-Fang3 |
| 1 Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074
2 Institute of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073
3 Department of Physics, Shanghai University, Shanghai 200436 |
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| Cite this article: |
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YANG Xiao-Yan, LIU De-Ming, XIE Wen-Chong et al 2007 Chin. Phys. Lett. 24 458-461 |
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Abstract We present a new optical sensor based on surface plasmon resonance (SPR) enhanced lateral optical beam displacements. Compared with the traditional SPR methods, the new method provides higher sensitivity to the sensor system. Theoretical simulations show that the refractive index (RI) detection sensitivity of the SPR sensor based on the displacement measurement has a strong dependence on the thickness of the metal film. When the optimal thickness of the metal film is selected, the RI resolution of the SPR sensor is predicted to be 2.2×10-7 refractive index units (RIU). Furthermore, it is found that the incidence angle can be used as a parameter to adjust the operating range of the sensor to different refractive index ranges.
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| Keywords:
42.79.-e
78.20.Bh
73.20.Mf
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Received: 20 July 2006
Published: 24 February 2007
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| PACS: |
42.79.-e
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(Optical elements, devices, and systems)
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78.20.Bh
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(Theory, models, and numerical simulation)
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73.20.Mf
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(Collective excitations (including excitons, polarons, plasmons and other charge-density excitations))
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