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Design, Fabrication and Measurement of Ni/Ti Multilayer Used for Neutron Monochromator |
ZHANG Zhong;WANG Zhan-Shan;ZHU Jing-Tao;WU Yong-Rong;MU Bao-Zhong;WANG Feng-Li;QIN Shu-Ji;CHEN Ling-Yan |
Institute of Precision Optical Engineering (IPOE), Department of Physics, Tongji University, Shanghai 200092 |
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Cite this article: |
ZHANG Zhong, WANG Zhan-Shan, ZHU Jing-Tao et al 2007 Chin. Phys. Lett. 24 3365-3357 |
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Abstract Ni/Ti multilayers, which can be used for neutron monochromators, are designed, fabricated and measured. Firstly, their reflectivities are simulated based on the Nevot--Croce model. Reflectivities of two Ni/Ti multilayer mirrors with periods d=10.3nm (M1) and d=7.8nm (M2) are calculated. In the calculation, the reflectivity of the Ni/Ti multilayer is taken as a function of the grazing angle with different roughness factors δ=1.0nm and delta=1.5nm. Secondly, these two multilayers are fabricated by the direct current magnetron sputtering technology. Thirdly their structures are characterized by small-angle x-ray diffraction. The roughness factors are fitted to be 0.68nm and 1.16nm for M1 and M2, respectively. Finally their reflective performances are measured on the V14 neutron beam line at the Berlin Neutron Scattering Centre (BENSC), Germany. The experimental data show that the grazing angle of the reflected neutron intensity peak increases, but the reflected neutron intensity decreases, with the decreasing periods of the multilayers.
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Keywords:
07.60.Hv
07.85.Fv
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Received: 26 May 2007
Published: 03 December 2007
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PACS: |
07.60.Hv
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(Refractometers and reflectometers)
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07.85.Fv
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(X- and γ-ray sources, mirrors, gratings, and detectors)
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