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SNOM Observations of Surface Plasmon Polaritons on Metal Heterostructures |
KITAZAWA Tazuko;MIYANISHI Shintaro;MURAKAMI Yoshiteru;KOJIMA Kunio;TAKAHASHI Akira |
Advanced Technology Research Laboratories SHARP CORPORATION, 2613-1, Ichinomoto-cho, Tenri, Nara, Japan |
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Cite this article: |
KITAZAWA Tazuko, MIYANISHI Shintaro, MURAKAMI Yoshiteru et al 2007 Chin. Phys. Lett. 24 2827-2829 |
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Abstract We observe surface plasmon polariton (SPP) refraction on a metal heterostructured sample with a scattered-type scanning near-field optical microscope (SNOM). The sample consists of Al and Au in-plane whose boundary is smooth enough with proper etching time. SPPs excited on the Al film travel to the boundary and a portion of SPPs propagates into the Au film. In addition, interference fringes appear in the SNOM image bent at the boundary. The result is analysed with effective index method and the refracted angle is explained by Snell's law.
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Keywords:
42.25.Gy
07.79.Fc
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Received: 15 June 2007
Published: 20 September 2007
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PACS: |
42.25.Gy
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(Edge and boundary effects; reflection and refraction)
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07.79.Fc
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(Near-field scanning optical microscopes)
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