| Original Articles |
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Quantitative Evaluation Methods of In-Line X-Ray Phase Contrast Techniques |
| LI Chen;LI Zheng;LI Cheng-Quan;YU Ai-Min |
| Department of Engineering Physics, Tsinghua University, Beijing 100084 |
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| Cite this article: |
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LI Chen, LI Zheng, LI Cheng-Quan et al 2007 Chin. Phys. Lett. 24 2823-2826 |
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Abstract By revealing the relationship between edge visibility and imaging parameters in in-line phase contrast imaging (PCI), we propose a method to quantitatively measure the contribution of absorption and phase shift from acquired images. We also prove that edge visibility will grow with the increasing source-object distance and object-detector distance. The result is validated by relative phase factor and by experiments conducted on a microfocus x-ray source. This method provides a new approach to evaluate in-line PCI images and is helpful for deciding imaging parameters.
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| Keywords:
41.50.+h
42.30.Va
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Received: 02 February 2007
Published: 20 September 2007
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| PACS: |
41.50.+h
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(X-ray beams and x-ray optics)
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42.30.Va
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(Image forming and processing)
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