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Double Electron Processes in Collisions of Partially Stripped Ions Cq+(q=1-4) with Helium |
DING Bao-Wei1;CHEN Xi-Meng1;YU De-Yang2;FU Hong-Bin1;LIU Zhao-Yuan1;SUN Guang-Zhi1;LIU Yu-Wen1;LU Yan-Xia1;XIE Jiang-Shan1;DU Juan1;GAO Zhi-Min1;CHEN Lin1;CUI Ying1;SHAO Jian-Xiong1;HE Zi-Feng1;CAI Xiao-Hong2 |
1School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000
2Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000 |
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Cite this article: |
DING Bao-Wei, CHEN Xi-Meng, YU De-Yang et al 2007 Chin. Phys. Lett. 24 94-96 |
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Abstract The multi-electron processes are investigated for 17.9--120keV/u C1+, 30--323keV/u C2+, 120--438keV/u C3+, 287--480keV/u C4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI) to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.
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Keywords:
34.70.+e
34.50.Fa
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Published: 01 January 2007
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PACS: |
34.70.+e
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(Charge transfer)
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34.50.Fa
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(Electronic excitation and ionization of atoms (including beam-foil excitation and ionization))
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