Chin. Phys. Lett.  2006, Vol. 23 Issue (9): 2576-2578    DOI:
Original Articles |
Effect of Alumina and Chromium Interlayers on Microstructures and Optical Properties of Thin Ag Films on Glass Substrates
SUN Xi-Lian1,2;SHAO Jian-Da1
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 2Graduate School, Chinese Academy of Sciences, Beijing 100049
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SUN Xi-Lian, SHAO Jian-Da 2006 Chin. Phys. Lett. 23 2576-2578
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Abstract Effects of alumina and chromium interlayers on the microstructure and optical properties of thin Ag films are investigated by using spectrophotometry, x-ray diffraction and AFM. The characteristics of Ag films in Ag/glass, Ag/Al2O3/glass and Ag/Cr/glass stacks are analysed. The results indicate that the insertion of an Al2O3 or Cr layer decreases the grains and influences the reflectance of Ag films. The reflectance of the Ag film can be increased by controlling the thickness of alumina interlayer. The stability of Ag films is improved and the adhesion of Ag films on glass substrates is enhanced by alumina as an interlayer.
Keywords: 78.66.-w      68.55.Jk      78.68.+m     
Published: 01 September 2006
PACS:  78.66.-w (Optical properties of specific thin films)  
  68.55.Jk  
  78.68.+m (Optical properties of surfaces)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2006/V23/I9/02576
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