Chin. Phys. Lett.  2006, Vol. 23 Issue (3): 716-719    DOI:
Original Articles |
Fabrication and Characterization of Well-Aligned Zn1-xMnxO Nanorods
CHANG Yong-Qin1;ZHANG Hong-Zhou2;LONG Yi1;YE Rong-Chang1
1School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083 2Department of Electronics and Material Engineering,Research School of Physical Science and Engineering, Australian National University, Australia
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CHANG Yong-Qin, ZHANG Hong-Zhou, LONG Yi et al  2006 Chin. Phys. Lett. 23 716-719
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Abstract Well-aligned Zn1-xMnxO nanorods have been synthesized successfully on bare silicon substrates by a simple evaporation method without using any catalyst. X-ray diffraction and electron microscopy studies demonstrate that the as-grown nanorods are of single wurtzite phase with a preferential growth direction along their c-axes. Quantitative energy-dispersive spectrum analysis reveals that the concentration of manganese is around 4 at.%. Magnetic measurements show the single-phase Zn1-xMnxO nanorod arrays exhibiting the paramagnetic behaviour. Photoluminescence spectra demonstrate that the Zn1-xMnxO nanorods preserve ultraviolet emission at room temperature.


Keywords: 81.07.Bc      68.37.Lp      75.75.+p      78.55.Et     
Published: 01 March 2006
PACS:  81.07.Bc (Nanocrystalline materials)  
  68.37.Lp (Transmission electron microscopy (TEM))  
  75.75.+p  
  78.55.Et (II-VI semiconductors)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2006/V23/I3/0716
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CHANG Yong-Qin
ZHANG Hong-Zhou
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YE Rong-Chang
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