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A Transient-State Simulation of Ionization Effects in a Microwave Tube |
| GONG Hua-Rong;GONG Yu-Bin;WEI Yan-Yu;LU Zhi-Gang;FAN Mei;WANG Wen-Xiang |
| National Key Laboratory of High-Power Vacuum Electronics, School of Physics Electronics, University of Electronic Science and Technology of China, Chengdu 610054 |
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| Cite this article: |
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GONG Hua-Rong, GONG Yu-Bin, WEI Yan-Yu et al 2006 Chin. Phys. Lett. 23 239-242 |
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Abstract A model for studying the ionization effects in a microwave tube has been developed. This model is simulated by a two-dimensional particle-in-cell code with the Mont Carlo collision model for the electron-neutral ionization process. The transient-state process of ion noise and ion focusing effects are observed. A simple theory about ion motion is given for interpreting the phenomenon of the ion moving to the wall of the tube when the beam is not neutralized. The computed result agrees with the experiment and simulation result.
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| Keywords:
84.40.Fe
84.40.Dc
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Published: 01 January 2006
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| PACS: |
84.40.Fe
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(Microwave tubes (e.g., klystrons, magnetrons, traveling-wave, backward-wave tubes, etc.))
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84.40.Dc
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(Microwave circuits)
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