| Original Articles |
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Relaxation of Dense Electron Plasma Induced by Femtosecond Laser in Dielectric Materials |
| SUN Quan;JIANG Hong-Bing;LIU Yi;ZHOU Yong-Heng;YANG Hong;GONG Qi-Huang |
| State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871 |
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| Cite this article: |
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SUN Quan, JIANG Hong-Bing, LIU Yi et al 2006 Chin. Phys. Lett. 23 192-192 |
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Abstract Electron plasma induced by a focused femtosecond pulse (130fs, 800nm) in dielectric materials (Soda Lime glass, K9 glass, and SiO2 crystal) is investigated by pump-probe shadow imaging technology. The relaxation of the electron plasma in the conduction band is discussed. In SiO2 crystals, a fast self-trapping process with a trapping time of 150fs is observed, which is similar to that in fused silica. However, in Soda Lime glass and K9 glass, no self-trapping occurs, and two decay processes are found: one is the energy relaxation process of conduction electrons within several picoseconds, another is an electron-hole recombination process with a timescale of 100ps. The electron collision time τ in the conduction band is also measured to be in the order of 1fs in all of these materials.
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| Keywords:
72.20.Jv
52.38.Dx
52.70.Kz
52.20.Fs
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Published: 01 January 2006
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| PACS: |
72.20.Jv
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(Charge carriers: generation, recombination, lifetime, and trapping)
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52.38.Dx
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(Laser light absorption in plasmas (collisional, parametric, etc.))
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52.70.Kz
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(Optical (ultraviolet, visible, infrared) measurements)
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52.20.Fs
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(Electron collisions)
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