| Original Articles |
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Determination of Thermal Diffusivity of a Manganite Thin Film |
| NIU Dong-Lin;LIU Xiao-Jun;HUANG Qiao-Jian;ZHANG Shu-Yi |
| State Key Laboratory of Modern Acoustics and Institute of Acoustics, Nanjing University, Nanjing 210093 |
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| Cite this article: |
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NIU Dong-Lin, LIU Xiao-Jun, HUANG Qiao-Jian et al 2005 Chin. Phys. Lett. 22 2659-2662 |
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Abstract Thermal diffusivity has been investigated in a manganite thin film La0.6Sr0.4MnO3 by means of transient grating (TG) technique at room temperature. A new method, which is generalized to two-layered samples of the thin film deposited on a semi-infinite substrate, is established to fit the TG signals. The thermal diffusivity of the La0.6Sr0.4MnO3 thin film with a thickness of 200nm on an MgO (100) substrate is determined to be 0.92mm2/s, which is slightly smaller than that of the single crystal sample (1mm2/s).
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| Keywords:
74.62.Dh
71.30.+h
72.80.Ga
66.30.Xj
67.55.Hc
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Published: 01 October 2005
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| PACS: |
74.62.Dh
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(Effects of crystal defects, doping and substitution)
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71.30.+h
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(Metal-insulator transitions and other electronic transitions)
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72.80.Ga
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(Transition-metal compounds)
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66.30.Xj
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(Thermal diffusivity)
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67.55.Hc
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