Chin. Phys. Lett.  2005, Vol. 22 Issue (10): 2511-2151    DOI:
Original Articles |
Design and Fabrication of Broad Angular Response Supermirror for Hard X-Ray Optics
ZHANG Zhong;WANG Zhan-Shan;WANG Feng-Li;WU Wen-Juan;WANG Hong-Chang;QIN Shu-Ji;CHEN Ling-Yan
Institute of Precision Optical Engineering, Department Of Physics, Tongji University, Shanghai 200092
Cite this article:   
ZHANG Zhong, WANG Zhan-Shan, WANG Feng-Li et al  2005 Chin. Phys. Lett. 22 2511-2151
Download: PDF(234KB)  
Export: BibTeX | EndNote | Reference Manager | ProCite | RefWorks
Abstract A broad angular response supermirror is designed by the simplex optimization method and fabricated by dc magnetron sputtering. The negative effect of the interfacial imperfection, mainly consulting from interface roughness and diffusion, is emerged in the calculation of the precise performance of the supermirror. The reflectivity of such a supermirror is measured by the x-ray diffraction instrument (XRD) at Cu Kα line (λ=0.154nm). The experimental reflectivity is about 30% in a fixed broad grazing incident angular range (0.55°--0.85°). The fitting data prove that the thickness of each layer, which is larger than the prospect 0.5nm, is different from the designed one and the roughness in the supermirror is about 0.85nm.
Keywords: 07.60.Hv      07.85.Fv     
Published: 01 October 2005
PACS:  07.60.Hv (Refractometers and reflectometers)  
  07.85.Fv (X- and γ-ray sources, mirrors, gratings, and detectors)  
TRENDMD:   
URL:  
https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2005/V22/I10/02511
Service
E-mail this article
E-mail Alert
RSS
Articles by authors
ZHANG Zhong
WANG Zhan-Shan
WANG Feng-Li
WU Wen-Juan
WANG Hong-Chang
QIN Shu-Ji
CHEN Ling-Yan
Related articles from Frontiers Journals
[1] LI Miao, XIAO Sha-Li, ZHANG Liu-Qiang, CAO Yu-Lin, CHEN Yu-Xiao, SHEN Min, WANG Xi. Investigation of the Imaging Polarization Effect Based on a Pixellated CdZnTe Detector[J]. Chin. Phys. Lett., 2010, 27(7): 2511-2151
[2] ZHAO Tong-Kai, QU Zhe-Chao, HAN Yan-Ling, LI Bin-Cheng . Two Optical Feedback Schemes for Cavity Ring-down Technique for High Reflectivity Measurements[J]. Chin. Phys. Lett., 2010, 27(10): 2511-2151
[3] MA Jie, XIE Chang-Qing, LIU Ming, CHEN Bao-Qin, YE Tian-Chun. Design, Fabrication and Test of a Soft X-Ray Even-Order Transmission Grating[J]. Chin. Phys. Lett., 2009, 26(9): 2511-2151
[4] ZHANG Zhong, WANG Zhan-Shan, ZHU Jing-Tao, WU Yong-Rong, MU Bao-Zhong, WANG Feng-Li, QIN Shu-Ji, CHEN Ling-Yan. Design, Fabrication and Measurement of Ni/Ti Multilayer Used for Neutron Monochromator[J]. Chin. Phys. Lett., 2007, 24(12): 2511-2151
[5] WANG Kai-Ge, WANG Lei, LIU Wen-Qing, NIU Han-Ben. Monte Carlo Study on Focus Properties of Portable Ultrabright Microfocus X-Ray Sources[J]. Chin. Phys. Lett., 2006, 23(9): 2511-2151
[6] ZHANG Zhong, WANG Zhan-Shan, ZHU Jing-Tao, WANG Feng-Li, WU Yong-Rong, QIN Shu-Ji, CHEN Ling-Yan. Design and Fabrication of Ni/Ti Multilayer for Neutron Supermirror[J]. Chin. Phys. Lett., 2006, 23(10): 2511-2151
[7] SUN Yu-Jie, CHENG Yao, WANG Feng, LI Jia-Ming,. Can a Single-Wall Carbon Nanotube be an X-Ray Waveguide?[J]. Chin. Phys. Lett., 2004, 21(3): 2511-2151
[8] ZHANG Zhong, WANG Zhan-Shan, WANG Feng-Li, QIN Shu-Ji, CHEN Ling-Yan. Design of Grazing-Incidence Broad-Band Multilayers for Hard X-Ray Reflectors[J]. Chin. Phys. Lett., 2004, 21(12): 2511-2151
[9] YU Hong, ZHU Pin-Pin, HAN Shen-Sheng, LUO Zhen-Lin, GAO Chen. In-Line Phase-Contrast Imaging Using Partially Coherent Hard X-Ray[J]. Chin. Phys. Lett., 2003, 20(2): 2511-2151
[10] GOU Quan-Bu, DONG Xiao-Li, LI Zu-Hao, ZHU Guo-Yi, HE Jing-Tang, TANG Xiao-Wei. Great Scintillating Properties of a YAP:Ce Crystal[J]. Chin. Phys. Lett., 2002, 19(7): 2511-2151
[11] HE Jing-tang, LÜ, Yu-sheng, CHEN Duan-bao, LI Zu-hao, BIAN Jian-guo, ZHU Guo-yi, TANG Xiao-wei, CHEN Gang, ZHENG Lian-rong, CHEN Xiao-hong, REN Shao-xia. Loss of Light Yield of Doped Lead Tungstate Crystals After Irradiation[J]. Chin. Phys. Lett., 1999, 16(10): 2511-2151
[12] LIU Wenqing, WANG Yaping, JIANG Rongxi, XIA Yuxing. Retroreflection Characteristics of the Surface Under Diode Laser Radiation[J]. Chin. Phys. Lett., 1992, 9(7): 2511-2151
Viewed
Full text


Abstract