Raman Study of Low-Temperature Phase Transitions in Polycrystalline Bi4Ti3O12 Thin Films

Chin. Phys. Lett.

2004, Vol. 21

Issue (9): 1819-1821 DOI:

Original Articles

Raman Study of Low-Temperature Phase Transitions in Polycrystalline Bi₄Ti₃O₁₂ Thin Films

DU Yu-Lei¹;CHEN Guang¹;ZHANG Ming-Sheng²

¹Department of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094 ²National Laboratory of Solid State Microstructures and Centre for Materials Analysis,Nanjing University, Nanjing 210093

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DU Yu-Lei, CHEN Guang, ZHANG Ming-Sheng 2004 Chin. Phys. Lett. 21 1819-1821

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Abstract Polycrystalline Bi₄Ti₃O₁₂ thin films were prepared on fused quartz substrates by pulsed laser deposition. The films were crystallized in the orthorhombic layer perovskite structure confirmed by x-ray diffraction and Raman spectroscopy. The two broad Raman bands centred at 57 and 93cm^-1 at 300K break up into clusters of several sharp Raman peaks at 90K. The temperature dependence of Raman spectra indicates the occurrence of monoclinic distortion of orthorhombic structure at low temperature in the as-prepared Bi₄Ti₃O₁₂ thin films.

Keywords: 78.30.Hv 64.70.Kb 68.55.Jk

Published: 01 September 2004

PACS:	78.30.Hv	(Other nonmetallic inorganics)
	64.70.Kb
	68.55.Jk

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y2004/V21/I9/01819

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