Chin. Phys. Lett.  2004, Vol. 21 Issue (7): 1262-1264    DOI:
Original Articles |
Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium
HUANG Yong-Yi1;WU Shi-Min1;ZHANG Xue-Mei1;LI Guang-Wu2;LU Fu-Quan1;YANG Fu-Jia1
1Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433 2Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 610003
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HUANG Yong-Yi, WU Shi-Min, ZHANG Xue-Mei et al  2004 Chin. Phys. Lett. 21 1262-1264
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Abstract Using the growth rate method, we obtain the single-electron detachment (SED) cross-sections for 5-30 keV C-+He, and double-electron detachment (DED) cross-sections for 5-15 keV C--+He. The SED cross-sections first increase with the increasing incident ion energy, and then decrease with further increase of the energy. The DED cross-sections increase with the increasing incident energy in the 5-15 keV region.
Keywords: 34.70.+e      34.50.Dy     
Published: 01 July 2004
PACS:  34.70.+e (Charge transfer)  
  34.50.Dy  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2004/V21/I7/01262
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HUANG Yong-Yi
WU Shi-Min
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YANG Fu-Jia
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