Correlation Between the IR Transmission Spectra and the CdZnTe Qualities

Chin. Phys. Lett.

2003, Vol. 20

Issue (9): 1600-1602 DOI:

Original Articles

Correlation Between the IR Transmission Spectra and the CdZnTe Qualities

LI Guo-Qiang;JIE Wan-Qi;GU Zhi;HUA Hui

State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072

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LI Guo-Qiang, JIE Wan-Qi, GU Zhi et al 2003 Chin. Phys. Lett. 20 1600-1602

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Abstract Tens of Cd_0.9Zn_0.1Te wafers from three ingots grown by the vertical Bridgman method (VBM) are characterized by infrared (IR) transmission. Four types of distinct IR transmission spectra are found for these wafers. Each of them corresponds to one kind of wafers with specified qualities. At the same time, approximate mathematical relations exist between the wafer dislocation density and their IR transmissions at the wavenumber 4000 cm^-1, as well as between the resistivity and the IR transmissions at the wavenumber 500 cm^-1. The reasons of the above results are attempted to be given.

Keywords: 78.30.Fs 33.20.Ea

Published: 01 September 2003

PACS:	78.30.Fs	(III-V and II-VI semiconductors)
	33.20.Ea	(Infrared spectra)

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y2003/V20/I9/01600

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