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Determination of Inelastic Mean Free Path by Electron Holography Along with Electron Dynamic Calculation |
| WANG Yan-Guo1;LIU Hong-Rong2;YANG Qi-Bin2;ZHANG Ze1 |
| 1Beijing Laboratory of Electron Microscopy, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080
2Institute of Physics, Xiangtan University, Xiangtan 411105
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| Cite this article: |
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WANG Yan-Guo, LIU Hong-Rong, YANG Qi-Bin et al 2003 Chin. Phys. Lett. 20 888-890 |
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Abstract Off-axis electron holography in a field emission gun transmission-electron microscope and electron dynamic calculation are used to determine the absorption coefficient and inelastic mean free path (IMFP) of copper. Dependence of the phase shift of the exit electron wave on the specimen thickness is established by electron dynamic simulation. The established relationship makes it possible to determine the specimen thickness with the calculated phase shift by match of the phase shift measured in the reconstructed phase image. Based on the measured amplitudes in reconstructed exit electron wave and reference wave in the vacuum, the examined IMFP of electron with energy of 200kV in Cu is obtained to be 96 nm.
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| Keywords:
61.14.Nm
68.37.Lp
42.30.Rx
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Published: 01 June 2003
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