Chin. Phys. Lett.  2002, Vol. 19 Issue (9): 1283-1286    DOI:
Original Articles |
Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method
CHENG Chuan-Fu1,2;LIU Chun-Xiang2;TENG Shu-yun1;ZHANG Ning-Yu3;LI Ru-Xin1;XU Zhi-Zhan1
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800 2Department of Physics, Shandong Normal University, Ji’nan 250014 3Shandong Institute of Architecture, Ji’nan 250014
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CHENG Chuan-Fu, LIU Chun-Xiang, TENG Shu-yun et al  2002 Chin. Phys. Lett. 19 1283-1286
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Abstract Theoretical analysis shows that the deviation roughness w and lateral correlation length ξ of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, the parameters w and ξ of the random surfaces with Gaussian correlation are extracted. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
Keywords: 42.25.Fx      42.30.-d     
Published: 01 September 2002
PACS:  42.25.Fx (Diffraction and scattering)  
  42.30.-d (Imaging and optical processing)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2002/V19/I9/01283
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CHENG Chuan-Fu
LIU Chun-Xiang
TENG Shu-yun
ZHANG Ning-Yu
LI Ru-Xin
XU Zhi-Zhan
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