Modification of YBa2Cu3O27-δ Thin Film Using Atomic Force Microscope

Chin. Phys. Lett.

2002, Vol. 19

Issue (6): 854-856 DOI:

Original Articles

Modification of YBa₂Cu₃O₂7-δ Thin Film Using Atomic Force Microscope

YOU Li-Xing¹;YIN Xiao-Bo²;FENG Yi-Jun¹;YANG Sen-Zu¹;KANG Lin¹;WANG Mu¹;WU Pei-Heng¹

¹Research Institute of Superconductor Electronics, Department of Electronic Science and Engineering, Nanjing University, Nanjing 210093 ²State Key Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing 210093

Cite this article:

YOU Li-Xing, YIN Xiao-Bo, FENG Yi-Jun et al 2002 Chin. Phys. Lett. 19 854-856

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Abstract A YBa₂Cu₃O₂7-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with operation parameters of the bias voltage, the moving velocity of probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficient in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossed the ridge.

Keywords: 74.76.Bz 87.64.Dz

Published: 01 June 2002

PACS:	74.76.Bz
	87.64.Dz	(Scanning tunneling and atomic force microscopy)

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y2002/V19/I6/0854

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	YOU Li-Xing
	YIN Xiao-Bo
	FENG Yi-Jun
	YANG Sen-Zu
	KANG Lin
	WANG Mu
	WU Pei-Heng

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