Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films

Chin. Phys. Lett.

2002, Vol. 19

Issue (6): 828-831 DOI:

Original Articles

Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films

ZHANG Shu-Yuan;PAN Deng-Yu;WU Zi-Qin

Structure Research Laboratory, University of Science and Technology of China, Hefei 230026

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ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin 2002 Chin. Phys. Lett. 19 828-831

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Abstract Fractal crystallization in Au/a-Ge bilayer films was studied by in-situ plane-view and cross-section transmission electron microscopy. The experimental evidences suggest that the fractal crystallization is controlled by both diffusion and reaction processes. The growth kinetics analysis indicates that both diffusion-limited aggregation and random successive nucleation mechanisms play an important role in fractal crystallization in Au/a-Ge bilayer films.

Keywords: 61.16.Bg

Published: 01 June 2002

PACS:

61.16.Bg

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y2002/V19/I6/0828

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