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A Z-Scan Study of LiNbO3 Thin Films
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WANG Qu-Quan1,2,3;SHI Jing3;YANG Bai-Feng3;LIU Hai-Lin3;XIONG Gui-Guang3;GONG Qi-Huang2;XUE Qi-Kun1 |
1International Center for Quantum Structure and State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080
2Department of Physics, State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871
3Department of Physics, Wuhan University, Wuhan 430072
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Cite this article: |
WANG Qu-Quan, SHI Jing, YANG Bai-Feng et al 2002 Chin. Phys. Lett. 19 677-679 |
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Abstract Poly-crystal LiNbO3 films on a fused SiO2 substrate are prepared by the rf sputtering technique. The third-order optical nonlinearity of the LiNbO3 films has been investigated by using Z-scan method with picosecond laser pulses at the wavelength of 532 nm. The nonlinear refractive index γ and nonlinear absorption coefficient β are determined to be -7.2 x 10-9cm2/W and 0.39cm/kW, respectively. The third-order optical nonlinearity x(3) of the LiNbO3 film is about 9.1 x 10-7 esu, which is considerably large than the reported value for Z-cut pure LiNbO3 crystals.
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Keywords:
42.65.An
42.70.Nq
81.15.Cd
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Published: 01 May 2002
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PACS: |
42.65.An
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(Optical susceptibility, hyperpolarizability)
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42.70.Nq
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(Other nonlinear optical materials; photorefractive and semiconductor materials)
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81.15.Cd
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(Deposition by sputtering)
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