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Energy Resolution Effects on Plasma Electron Temperature Measurements by Soft X-Ray Pulse-Height-Analysis |
| SHI Yue-Jiang; WAN Bao-Nian |
| Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031
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| Cite this article: |
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SHI Yue-Jiang, WAN Bao-Nian 2001 Chin. Phys. Lett. 18 562-563 |
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Abstract The soft x-ray pulse-height-analysis technique is a conventional tool to measure electron temperature on tokamak. The soft x-ray spectra distortion due to energy resolution of detector will affect the temperature and impurity concentration determination. To evaluate these effects, distorted spectra as functions of energy resolution are derived by numerical modeling. The results show that the low energy resolution detector can fit for the large-sized tokamak soft x-ray spectra.
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52.70.La
02.60.Cb
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Published: 01 April 2001
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| PACS: |
52.70.La
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(X-ray and γ-ray measurements)
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02.60.Cb
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(Numerical simulation; solution of equations)
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