Original Articles |
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Surface Acoustic Wave Velocity and Electromechanical Coupling
Coefficient of GaN Grown on (0001) Sapphire by Metal-Organic Vapor Phase Epitaxy |
CHEN Zhen1;LU Da-Cheng1;WANG Xiao-Hui1;LIU Xiang-Lin1;HAN Pei-De1;YUAN Hai-Rong1;WANG Du1;WANG Zhan-Guo1;HE Shi-Tang2;LI Hong-Lang2;YAN Li3;CHEN Xiao-Yang3 |
1Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083
2Institute of Acoustics, Chinese Academy of Sciences, Beijing 100080
3Surface Acoustic Wave Corporation, Institute No.23 of China Aerospace Corporation, Beijing 100854
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Cite this article: |
CHEN Zhen, LU Da-Cheng, WANG Xiao-Hui et al 2001 Chin. Phys. Lett. 18 1418-1419 |
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Abstract High-quality and high-resistivity GaN films were grown on (0001) sapphire face by metal-organic vapor phase epitaxy. To measure the surface acoustic wave properties accurately, we deposited metallized interdigital trans-ducers on the GaN surface. The acoustic surface wave velocity and electromechanical coupling coefficient were measured, respectively, to be 5667m/s and 1.9% by the pulse method.
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Keywords:
81.05.Ea
43.35.Pt
81.15.Gh
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Published: 01 October 2001
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PACS: |
81.05.Ea
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(III-V semiconductors)
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43.35.Pt
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(Surface waves in solids and liquids)
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81.15.Gh
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(Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.))
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