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Au/Ti/p-Diamond Ohmic Contacts Prepared by Radio-Frequency Sputtering |
ZHEN Cong-Mian;LIU Xue-Qin;YAN Zhi-Jun;GONG Heng-Xiang;WANG Yin-Yue |
Department of Physics, Lanzhou University, Lanzhou 730000 |
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Cite this article: |
ZHEN Cong-Mian, LIU Xue-Qin, YAN Zhi-Jun et al 2000 Chin. Phys. Lett. 17 827-828 |
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Abstract The as-deposited Au/Ti/p-diamond contacts prepared by rf sputtering are ohmic. The ohmic characteristics of the contacts are improved after annealing. As for the as-deposited and annealed contacts, the specific contact resistivities of 2.886 x 10-3 and 2.040 x 10-4 Ω.cm2 are obtained, respectively. The x-ray photoelectron spectroscopy analysis indicates that the titanium carbide formation occurs at the interface between titanium and the diamond substrate in the as-deposited state, and no TiO2 is observed.
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Keywords:
73.40.Ns
73.40.Cg
68.48.+f
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Published: 01 November 2000
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