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High Resolution Elastic Recoil Detection Analysis with Q3D Magnetic Spectrometer |
LU Xiu-qin;FU Chang-bo;LIANG Gang;GUO Ji-Yu;ZHAO Kui;LI Shu-yuan;LIU Jian-cheng;JIANG Hua;YANG Bing-fan |
Department of Nuclear Physics, China Institute of Atomic Energy, Beijing 102413 |
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Cite this article: |
LU Xiu-qin, FU Chang-bo, LIANG Gang et al 1999 Chin. Phys. Lett. 16 493-495 |
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Abstract Elastic recoil detection analysis technique with ΔE - E particle identification and Q3D momentum analysis has been developed to determine high resolution depth profiles in thin foils and multilayer systems. A depth resolution of 1.2nm was achieved at the surface of the samples using a high quality 100MeV 127I beam. The method was applied to depth profile analysis of C/LiF multilayers, superconductor and GaN foil samples.
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Keywords:
25.70.Bc
29.30.Ep
68.55.Ln
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Published: 01 July 1999
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PACS: |
25.70.Bc
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(Elastic and quasielastic scattering)
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29.30.Ep
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(Charged-particle spectroscopy)
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68.55.Ln
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(Defects and impurities: doping, implantation, distribution, concentration, etc.)
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