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Femtosecond Degenerate Four-Wave-Mixing in ZnO Microcrystallite Thin Films |
| ZHANG Wei-li1;WANG Qing-yue1;CHAI LU2;XING Qi-rong1;K. S . Wong3;H. Wang3;Z. K. Tang3;G. K. L. Wong3;R. Jain4 |
| 1Ultrafast Laser Laboratory, School of Precision Instruments & Optoelectronics Engineering, and Optoelectronic Information Science and Technology Laboratory, 2School of Science, Tianjin University, Tianjin 300072
3Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
4Center for High Technology Materials, University of New Mexico, 1313 Goddard SE, Albuquerque, NM 87106, USA
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| Cite this article: |
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ZHANG Wei-li, WANG Qing-yue, CHAI LU et al 1999 Chin. Phys. Lett. 16 418-419 |
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Abstract Transient third-order optical nonlinearity Χ(3) of ZnO microcrystallite thin films is measured at various temperatures by using femtosecond degenerate four-wave-mixing. Room-temperature excitonic enhancement of Χ(3) is observed. The magnitude of Χ(3)) ranges between 10-4 to 10-6 esu from 4.2K to room temperature. The measured Χ(3)response time ranging from 200 to 300fs is ultrafast for temperature down to 4.2K.
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| Keywords:
42.65.Re
42.65.Hw
42.70.Ng
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Published: 01 June 1999
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| PACS: |
42.65.Re
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(Ultrafast processes; optical pulse generation and pulse compression)
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42.65.Hw
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(Phase conjugation; photorefractive and Kerr effects)
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42.70.Ng
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