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On the Zero-Order Diffraction of Phase Mask |
| WEN Peng-yue;CUI Xiao-ming;LIU Hong-du;E. Y. B. Pun1;P. S . Chung1 |
| Department of Physics, Peking University, Beijing 100871
1Department of Electronic Engineering, City University of Hong Kong
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| Cite this article: |
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WEN Peng-yue, CUI Xiao-ming, LIU Hong-du et al 1997 Chin. Phys. Lett. 14 830-833 |
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Abstract The zero-order diffraction of phase grating mask is analysed for rectangular and sinusoidal corrugated profiles, and a novel method is proposed for determining the depth and duty cycle parameter by the diffraction measurement at different wavelengths.
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| Keywords:
42.40.Lx
42.40.Eq
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Published: 01 November 1997
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| PACS: |
42.40.Lx
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(Diffraction efficiency, resolution, and other hologram characteristics)
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42.40.Eq
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(Holographic optical elements; holographic gratings)
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