| Original Articles |
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Investigation of C60 Single Crystal by X-Ray Methods |
| LI Chaorong;MAI Zhenhong;WANG Gang;WANG Yutian1,
WU Lansheng;CUI Shufan;XIE Sishen;JIANG Jianhua2
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| Institute of Physics, Academia Sinica, Beijing 100080
1Institute of Semiconductors, Academia Sinica, Beijing 100083,
2Beijing Synchrotron Radiation Laboratory, P. O. Box 918, Beijing 100039
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| Cite this article: |
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LI Chaorong, MAI Zhenhong, WANG Gang et al 1995 Chin. Phys. Lett. 12 217-220 |
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Abstract C60 single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topography and x-ray double crystal diffraction with Cu Kα1 radiation on conventional x-ray source. The results show that the crystal is rather well crystallized. The x-ray topographies give an evidence of dendritic growth mechanism of C60 single crystal, and x-ray double crystal diffraction rocking curve shows that there are mosaic structural defects in the sample. A phase transition at 249 ± 1.5K from a simple cubic to a face centered cubic structure is confirmed by in situ observation of synchrotron radiation white beam x-ray topography with the temperature varing from 230 to 295K.
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| Keywords:
61.10.-i
61.72.Dd
81.10.Bk
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Published: 01 April 1995
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| PACS: |
61.10.-i
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61.72.Dd
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(Experimental determination of defects by diffraction and scattering)
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81.10.Bk
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(Growth from vapor)
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