Ni-B Nanometer Particles Observed by Scanning Tunneling Microscopy

Chin. Phys. Lett.

1994, Vol. 11

Issue (9): 561-564 DOI:

Original Articles

Ni-B Nanometer Particles Observed by Scanning Tunneling Microscopy

LI Xiangyang;CHENG Huansheng;YANG Fujia;YANG Xinju¹;YANG Jun²

T. D. Lee Physics Laboratory, Fudan University, Shanghai 200433 ¹Department of Materials Science, Fudan University, Shanghai 200433 ²Department of Chemistry, Fudan University, Shanghai 200433

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LI Xiangyang, CHENG Huansheng, YANG Fujia et al 1994 Chin. Phys. Lett. 11 561-564

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Abstract The samples of the Ni-B nanometer particles which were suitable for scanning tunneling microscopy (STM) have been prepared and observed. Our experimental results suggest that the vertical height of the nanometer particles imaged by the STM has strongly related to the method of the sample preparation. For the Ni-B nanometer particle the water and impurity layer adsorbed to the particle surface played an important role in the conduction mechanism. At last alcohol can be used as a tool to disperse the nanometer particles on the highly oriented pyrolytic graphite support.

Keywords: 61.16.Bg 81.20.-n

Published: 01 September 1994

PACS:	61.16.Bg
	81.20.-n	(Methods of materials synthesis and materials processing)

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y1994/V11/I9/0561

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	LI Xiangyang
	CHENG Huansheng
	YANG Fujia
	YANG Xinju
	YANG Jun

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