| Original Articles |
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Retroreflection Characteristics of the Surface Under Diode Laser Radiation |
| LIU Wenqing;WANG Yaping;JIANG Rongxi;XIA Yuxing |
| Laser Spectroscopy Laboratory, Anhui Institute of Optics
and Fine Mechanics, Academia Sinica, Hefei 230031
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| Cite this article: |
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LIU Wenqing, WANG Yaping, JIANG Rongxi et al 1992 Chin. Phys. Lett. 9 386-389 |
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Abstract The retroreflection characteristics of metal surfaces sprayed with different mixture of Si3N4 powder and plastic powder were evaluated by an automatic system developed at our laboratory, which normally used to measure the absolute retroreflectance of various surfaces without any reference standard. The preliminary results obtained seem to indicate that the characterization of the retroreflection distribution can be controlled as needed by selecting the sample surface material and/or its mixture. This property may be used in analysis of target signatures.
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| Keywords:
81.70.-q
78.55.-m
07.60.Hv
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Published: 01 July 1992
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| PACS: |
81.70.-q
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(Methods of materials testing and analysis)
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78.55.-m
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(Photoluminescence, properties and materials)
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07.60.Hv
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(Refractometers and reflectometers)
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