Probe-Hole Field Emission Microscope System Controlled by Computer

Chin. Phys. Lett.

1991, Vol. 8

Issue (9): 446-449 DOI:

Original Articles

Probe-Hole Field Emission Microscope System Controlled by Computer

GONG Yunming;ZENG Haishan

Department of Radio-Electronics, Peking University, Beijing 100871

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GONG Yunming, ZENG Haishan 1991 Chin. Phys. Lett. 8 446-449

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Abstract A probe-hole field emission microscope system, controlled by an Apple II computer, has been developed and operated successfully for measuring the work function of a single crystal plane. The work functions on the clean W(100) and W(111) planes are measured to be 4.67eV and 4.45eV, respectively.

Keywords: 07.80.+x 79.90.+q

Published: 01 September 1991

PACS:	07.80.+x
	79.90.+q

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y1991/V8/I9/0446

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