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Mapping the Uniformity of Deep Level Defects Distribution by Scanning Photoluminescence |
WENG Yumin;LIN Song;ZONG Xiangfu |
Institute of Materials Science, Fudan University, Shanghai 200433 |
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Cite this article: |
WENG Yumin, LIN Song, ZONG Xiangfu 1991 Chin. Phys. Lett. 8 380-383 |
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Abstract Deep level defects in undoped semi-insulating GaAs were investigated by photo-luminescence technique at room temperature. The 0.69eV band is associated with the main mid-gap level EL2, and the 0.76eV band is suggested to be caused by some native point defects related to excess As, such as As anti-site defect. Two-dimensional and pseudo three-dimensional plots of the EL2 related band have been observed for as grown and annealed wafers.
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Keywords:
78.55.Cr
71.55.Eq
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Published: 01 July 1991
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