Chin. Phys. Lett.  1991, Vol. 8 Issue (7): 380-383    DOI:
Original Articles |
Mapping the Uniformity of Deep Level Defects Distribution by Scanning Photoluminescence
WENG Yumin;LIN Song;ZONG Xiangfu
Institute of Materials Science, Fudan University, Shanghai 200433
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WENG Yumin, LIN Song, ZONG Xiangfu 1991 Chin. Phys. Lett. 8 380-383
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Abstract Deep level defects in undoped semi-insulating GaAs were investigated by photo-luminescence technique at room temperature. The 0.69eV band is associated with the main mid-gap level EL2, and the 0.76eV band is suggested to be caused by some native point defects related to excess As, such as As anti-site defect. Two-dimensional and pseudo three-dimensional plots of the EL2 related band have been observed for as grown and annealed wafers.
Keywords: 78.55.Cr      71.55.Eq     
Published: 01 July 1991
PACS:  78.55.Cr (III-V semiconductors)  
  71.55.Eq (III-V semiconductors)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1991/V8/I7/0380
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