| Original Articles |
|
|
|
|
COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION
|
| TENG Feng en;LIU Baozhang;LI Yanqin |
| Institute of Materials Science, Jilin University, Changchun 130023 |
|
| Cite this article: |
|
TENG Feng en, LIU Baozhang, LI Yanqin 1990 Chin. Phys. Lett. 7 312-315 |
|
|
|
Abstract The microstructure of alpha brass deformed to various degree ε was examined with positron annihilation technique and X-ray profile analysis. Stretch stress δ, positron annihilation probabilities Γ1, effective subgrain size Deff, positron lifetime T1 , dislocation density ρ, positron lifetime T2 and T etc. were measured as functions of deformation degree ε . Combined analyses of these curves were performed and positron annihilation models of single vacancy, dislocation, vacancy group and microvoid were suggested.
|
| Keywords:
61.70.-r
|
|
|
Published: 01 July 1990
|
|
|
|
|
|
|
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
