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REGROWTH OF MBE-GaAs FILMS ON Si SUBSTRATES BY HIGH ENERGY ION-IMPLANTATION AND SUBSEQUENT ANNEALING
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XIAO Guangming;YIN Shiduan;ZHANG Jingping;FAN Tiwen;LIU Jiarui*;DING Aiju*;ZHOU Junming*;ZHU Peiruan* |
Institute of Semiconductors, Academia Sinica, Beijing
*Institute of Physics, Academia Sinica, Beijing |
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Cite this article: |
XIAO Guangming, YIN Shiduan, ZHANG Jingping et al 1989 Chin. Phys. Lett. 6 451-454 |
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Abstract 4.2MeV 7Li channeling technique, laser Raman scattering spectrometry, and TEM have been utilized to study the regrowth of MBE-GaAs films of ~μm thick on Si substrates by Si+ implantation (0.6-2.6Me V) and subsequent rapid thermal annealing. The results showed that crystalline disorder was greatly reduced in the recrystalized layers especially at the interface.
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Keywords:
61.70.At
81.10.Jt
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Published: 01 October 1989
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PACS: |
61.70.At
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81.10.Jt
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(Growth from solid phases (including multiphase diffusion and recrystallization))
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Abstract
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