Chin. Phys. Lett.  1988, Vol. 5 Issue (5): 197-200    DOI:
Original Articles |
ION ENDUCED ADHESION BETWEEN METALS AND OXIDES
CHENG Guoan*;LI Hengde*;LIU Baixin
*Department of Engineering Physics, Tsinghua University, Beijing Center of Theoretical Physics, CCAST(Wor1d Lab.) Department of Engineering Physics, Tsinghua University, Beijing
Cite this article:   
CHENG Guoan, LI Hengde, LIU Baixin 1988 Chin. Phys. Lett. 5 197-200
Download: PDF(46KB)  
Export: BibTeX | EndNote | Reference Manager | ProCite | RefWorks
Abstract The enhancement of adhesion between deposited metal layers ( Ti and Cu) and the oxide substrates at RT and 300°c respectively was studied by argon ion irradiation to various doses. The experimental results showed that the adhesive strength increased after a threshold dose irradiation and reached as aturation value at higher doses in all metal/oxide pairs. RBS spectra showed that chemical reaction had taken place in Ti /oxide case, while in Cu/oxide case, both RBS and XPS analysis showed that no evidence of such reaction had been induced.
Published: 01 May 1988
TRENDMD:   
URL:  
https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1988/V5/I5/0197
Service
E-mail this article
E-mail Alert
RSS
Articles by authors
CHENG Guoan
LI Hengde
LIU Baixin
Viewed
Full text


Abstract