FRACTAL STRUCTURE APPEARED IN ION-IMPLANTED a-Ge/Ag BILAYER FILMS AFTER ANNEALING

Chin. Phys. Lett.

1988, Vol. 5

Issue (10): 445-448 DOI:

Original Articles

FRACTAL STRUCTURE APPEARED IN ION-IMPLANTED a-Ge/Ag BILAYER FILMS AFTER ANNEALING

HOU Jianguo;WU Ziqin

Fundamental Physics Center, University of Science and Technology of China, Hefei

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HOU Jianguo, WU Ziqin 1988 Chin. Phys. Lett. 5 445-448

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Abstract The agglomeration in ion-implanted a-Ge/Ag bilayer films has been investigated by use of transmission electron microscopy (TEM). There are two kinds of fractal structures, one of which is soot - like with fractal dimension (FD) of 1.515, the other is snow - flake - like with FD of 1.797. The result is compared with that of the unimplanted film, and the mechanism of the occurrence of fractal regions is also discussed.

Keywords: 0570Jk

Published: 01 October 1988

PACS:	6855
	0570Jk

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y1988/V5/I10/0445

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