Radiation Induced Optical Absorption of Cubic Lead Fluoride Crystals and the Effect of Annealing

doi:10.1088/0256-307X/31/8/086102

Chin. Phys. Lett.

2014, Vol. 31

Issue (08): 086102 DOI: 10.1088/0256-307X/31/8/086102

CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES

Radiation Induced Optical Absorption of Cubic Lead Fluoride Crystals and the Effect of Annealing

REN Guo-Hao^1**, CHEN Xiao-Feng¹, LI Huan-Ying¹, WU Yun-Tao¹, SHI Hong-Sheng², QIN Lai-Shun²

¹Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 201800
²College of Material Sciences and Engineering, Jiliang University of China, Hangzhou 310018

Cite this article:

REN Guo-Hao, CHEN Xiao-Feng, LI Huan-Ying et al 2014 Chin. Phys. Lett. 31 086102

Download: PDF(588KB)
Export: BibTeX | EndNote | Reference Manager | ProCite | RefWorks

Abstract Transparent and colorless lead fluoride crystals with sizes of 20×20×20 (mm³) are irradiated with several doses of γ-rays from a ⁶⁰Co source. Their transmittance spectra before and after irradiation are measured, and a new parameter ΔT=T_b?T_a is defined to evaluate the irradiation damage. Three optical absorption bands peaking at 270 nm, 370 nm and 500 nm are found in the plots of ΔT versus wavelength, and their intensities increase with the irradiation dose. These optical absorption bands, except the one at 270 nm, can recover spontaneously with time. Thermal annealing treatment can enhance this recovery of the transmittance, while the optimum annealing temperature for different samples depends on the irradiation dose.

PACS:	61.80.Cb	(X-ray effects)
	61.80.Ed	(γ-ray effects)
	61.82.Ms	(Insulators)

TRENDMD:

URL:

https://cpl.iphy.ac.cn/10.1088/0256-307X/31/8/086102 OR https://cpl.iphy.ac.cn/Y2014/V31/I08/086102

Service
	E-mail this article
	E-mail Alert
	RSS
Articles by authors
	REN Guo-Hao
	CHEN Xiao-Feng
	LI Huan-Ying
	WU Yun-Tao
	SHI Hong-Sheng
	QIN Lai-Shun

[1] Anderson D F, Kobayashi M, Woody C L and Yoshimura Y 1990 Nucl. Instrum. Methods Phys. Res. Sect. A 290 385
[2] Achenbach P, Altarev I, Grimm K, Hammid T, Harrach D V, Lopes A, Hofmann J, Hofmann H, M Kabu? E, Kobis S, Maas F E, Schilling E and Strǒher H 1998 Nucl. Instrum. Methods Phys. Res. Sect. A 416 357
[3] Yoshimuray and Makia 1975 Nucl. Instrum. Methods Phys. Res. Sect. A 126 541
[4] Achenbach P, Baunack S, Grimm K, Hammid T, Harrach D V, Lopes A, Maas F E, Schilling E and Strǒher H 2001 Nucl. Instrum. Methods Phys. Res. Sect. A 465 318
[5] Appuhn R D, Brasse F, Deckers T, Kolanoski H, Korbel V, Lindner A, Meier K, Speilmann S, Vaikar S, Walther A and Wegener D 1994 Nucl. Instrum. Methods Phys. Res. Sect. A 350 208
[6] Ren G H, Shen D Z, Wang S H and Yin Z W 2001 Chin. Phys. Lett. 18 976
[7] Kozma P, Bajgar R and Kozma P Jr 2004 Nucl. Instrum. Methods Phys. Res. Sect. A 484 149
[8] Xiang X, Zu T, Zhu S, Ding T H and Wang L M 2006 Opt. Mater. 28 930

Related articles from Frontiers Journals

[1]	M. P. Sarma, J. M. Kalita, G. Wary. X-Ray Radiation Sensing Properties of ZnS Thin Film: A Study on the Effect of Annealing[J]. Chin. Phys. Lett., 2017, 34(7): 086102
[2]	ZHU Xiao-Li, XIE Chang-Qing, ZHANG Man-Hong, LIU Ming, CHEN Bao-Qin, PAN Feng. Fabrication of 11-nm-Wide Silica-Like Lines Using X-Ray Diffraction Exposure[J]. Chin. Phys. Lett., 2009, 26(8): 086102

Viewed

Full text

Abstract