| GENERAL |
|
|
|
|
Measurement of Optical Frequency Stability by Using Spectral-Hole Burning |
| WANG Wei1,2**, MA Xiu-Rong1,2, CHEN Lei1,2, ZHANG Shuang-Gen2, ZHAO Jian1,2 |
1Engineering Research Center on Communication Devices (Ministry of Education), School of Computer and Communication Engineering, Tianjin University of Technology, Tianjin 300384
2Tianjin Key Laboratory of Film Electronic and Communication Device, School of Electronic Information Engineering, Tianjin University of Technology, Tianjin 300384
|
|
| Cite this article: |
|
WANG Wei, MA Xiu-Rong, CHEN Lei et al 2012 Chin. Phys. Lett. 29 100601 |
|
|
|
|
Abstract A method of measuring laser frequency stability is proposed by using the spectral-hole-burning technique. The power spectra of the measured laser can be recorded as a spectral hole, and the engraving time of the spectral hole is mapped into the frequency of the measured laser. Frequency fluctuation can be expressed by spectral hole frequency variation with different engraving times. By using the proposed method, the frequency stability of the external-cavity diode laser is measured to be 2.22×10?9 with an integration time of 20 ms. The frequency stability measurement resolution reaches 14 kHz and the repetition rate is 50 Hz. Compared to the conventional method, it avoids the need for a high stability reference laser source.
|
|
|
Received: 31 May 2012
Published: 01 October 2012
|
|
| PACS: |
06.30.Ft
|
(Time and frequency)
|
| |
06.30.-k
|
(Measurements common to several branches of physics and astronomy)
|
| |
42.60.Pk
|
(Continuous operation)
|
|
|
|
|
|
[1] Young B C, Cruz F C, Itano W M and Bergquist J C 1999 Appl. Phys. B 82 3799
[2] Nevsky A Y, Eichenseer M, Zanthier J V and Walther H 2002 Opt. Commun. 210 91
[3] Tarallo M G, Poli N, Schioppo M, Sutyrin D and Tino G M 2011 Appl. Phys. B 103 17
[4] Ozdur I, Mandridis D, Mohammad U P, Akbulut M, Hoghooghi N and Delfyett P J 2011 IEEE Photon. Technol. Lett. 23 263
[5] Mitsunaga M 1992 Opt. Quantum Electron. 24 1137
[6] Thiela C W, Bottger T and Cone R L 2011 J. Lumin. 131 353
[7] Zhao L Z, Qin Y, Lu Z Z and Nie Y X 1997 Acta Phys. Sin. 46 1487 (in Chinese)
[8] Li Y Z, Hemmer P, Kim C, Zhang H L and Wang L H 2008 Opt. Lett. 16 14862
[9] Merkel K D, Mohan R K, Cole Z, Chang T, Olson A and Babbitt W R 2004 J. Lumin. 107 62
[10] Barber Z W, Harrington C, Thiel C W, Babbitt W R, Mohan R K 2010 J. Lumin. 130 1614
[11] Trommsdorff H P, Corval A and Laue L V 1995 Pure Appl. Chem. 67 191
[12] Strickland N M, Sellin P B, Sun Y, Carlsten J L and Cone R L 2000 Phys. Rev. B 62 1473
[13] Guillaume G, Chauve A, Crozatier V, Lorgeré I, Gou?t J L L and Bretenaker F 2007 J. Opt. Soc. Am. B 24 457
[14] Bjorklund G C and Levenson M D 1983 Appl. Phys. B 32 145
[15] Black E D 2001 Am. J. Phys. 69 79 |
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
