| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Behaviour of Charge Carriers in As-Deposited and Annealed Undoped TCO Films |
| ZHOU Yan-Wen**, WU Fa-Yu, ZHENG Chun-Yan
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| School of Materials Science and Metallurgy, University of Science and Technology Liaoning, Anshan 114051 |
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| Cite this article: |
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ZHOU Yan-Wen, WU Fa-Yu, ZHENG Chun-Yan 2011 Chin. Phys. Lett. 28 107307 |
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Abstract We examine the structures, cut-off points of transmittance spectra and electric properties of undoped ZnO, SnO2 and CdO films by scanning electron microscopy, x-ray diffraction, spectrophotometer and Hall-effect measurements, respectively. The films are deposited by using an rf magnetron sputtering system from powder targets in argon and then annealed in vacuum. The structures and properties of the as-deposited films are compared with those of the annealed one. We try to explain the behaviour of charge carriers based on the semiconductor physics theory.
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| Keywords:
73.20.At
73.50.Bk
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Received: 21 March 2011
Published: 28 September 2011
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| PACS: |
73.20.At
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(Surface states, band structure, electron density of states)
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73.50.Bk
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(General theory, scattering mechanisms)
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