| CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Elimination of the Coherent Artifact in a Pump-Probe Experiment by Directly Detecting the Background-Free Diffraction Signal |
| LIU Hui, ZHANG Hang, SI Jin-Hai**, YAN Li-He, CHEN Feng, HOU Xun
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Key Laboratory for Physical Electronics and Devices of the Ministry of Education & Shaanxi Key Lab of Information Photonic Technique, School of Electronics & information Engineering, Xi'an Jiaotong University, Xi'an 710049
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| Cite this article: |
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LIU Hui, ZHANG Hang, SI Jin-Hai et al 2011 Chin. Phys. Lett. 28 086602 |
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Abstract The influence of the coherent artifact in a semiconductor Ga-doped ZnO film on femtosecond pump-probe measurement is studied. The coherent artifact mixed into the pump-probe signal can be directly inspected by detecting the background-free first-order diffraction signal induced by the interference between the pump and probe pulses. Experimental results show that by varying the polarization angle or adjusting the relative intensity between the pump and probe pulses, the coherent artifact can be eliminated from the pump-probe measurement.
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| Keywords:
66.30.Fq
82.53.Eb
42.65.Re
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Received: 17 May 2011
Published: 28 July 2011
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| PACS: |
66.30.Fq
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(Self-diffusion in metals, semimetals, and alloys)
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82.53.Eb
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(Pump probe studies of photodissociation)
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42.65.Re
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(Ultrafast processes; optical pulse generation and pulse compression)
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