CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
|
|
|
|
Elimination of the Coherent Artifact in a Pump-Probe Experiment by Directly Detecting the Background-Free Diffraction Signal |
LIU Hui, ZHANG Hang, SI Jin-Hai**, YAN Li-He, CHEN Feng, HOU Xun
|
Key Laboratory for Physical Electronics and Devices of the Ministry of Education & Shaanxi Key Lab of Information Photonic Technique, School of Electronics & information Engineering, Xi'an Jiaotong University, Xi'an 710049
|
|
Cite this article: |
LIU Hui, ZHANG Hang, SI Jin-Hai et al 2011 Chin. Phys. Lett. 28 086602 |
|
|
Abstract The influence of the coherent artifact in a semiconductor Ga-doped ZnO film on femtosecond pump-probe measurement is studied. The coherent artifact mixed into the pump-probe signal can be directly inspected by detecting the background-free first-order diffraction signal induced by the interference between the pump and probe pulses. Experimental results show that by varying the polarization angle or adjusting the relative intensity between the pump and probe pulses, the coherent artifact can be eliminated from the pump-probe measurement.
|
Keywords:
66.30.Fq
82.53.Eb
42.65.Re
|
|
Received: 17 May 2011
Published: 28 July 2011
|
|
PACS: |
66.30.Fq
|
(Self-diffusion in metals, semimetals, and alloys)
|
|
82.53.Eb
|
(Pump probe studies of photodissociation)
|
|
42.65.Re
|
(Ultrafast processes; optical pulse generation and pulse compression)
|
|
|
|
|
[1] Wundke K, Pötting S, Auxier J, Schülzgen A, Peyghambarian N and Borrelli N F 2000 Appl. Phys. Lett. 76 10
[2] Liu X, Liu W, Yin J, Qu J, Lin Z and Niu H 2011 Chin. Phys. Lett. 28 034202
[3] Li F, Meng F, Feng W, Wang Sh, Tian H and Gong Q 2010 Chin. Phys. Lett. 27 068202
[4] Elim H I, Ji W, Ma G H, Lim K Y, Sow C H and Huan C H A 2004 Appl. Phys. Lett. 85 1799
[5] Tsai T -R, Chang C -F and Gwo S 2007 Appl. Phys. Lett. 90 252111
[6] Gopinath J T, Thoen E R, Koontz E M, Grein M E, Kolodziejski L A, Ippen E P and Donnelly J P 2001 Appl. Phys. Lett. 78 3409
[7] Sanchez S, De Matos C and Pugnet M 2001 Appl. Phys. Lett. 78 3779
[8] Ye H, Wicks G W and Fauchet P M 2000 Appl. Phys. Lett. 77 1185
[9] Sun C -K, Vallée F, Keller S, Bowers J E and DenBaars S P 1997 Appl. Phys. Lett. 70 2004
[10] Lioudakis E, Othonos A, Dimakis E, Iliopouios E and Georgakilas A 2006 Appl. Phys. Lett. 88 121128
[11] Si J and Hirao K 2007 Appl. Phys. Lett. 91 091105
[12] Luo C W, Wang Y T, Chen F W, Shih H C and Kobayashi T 2009 Opt. Express 17 11321
[13] Borri P, Romstad F, Langbein W, Kelly A E, M ørk J and Hvam J M 2000 Opt. Express 7 107
[14] Vandeny Z and Tauc J 1981 Opt. Commun. 39 396
[15] Palfrey S L and Heinz T F 1985 J. Opt. Soc. Am. B 2 674
[16] Sanchez F 1992 J. Opt. Soc. Am. B 9 2196
[17] Cundiff S T 2008 Opt. Express 16 4639
[18] Yan L H, Yue J J, Si J H and Hou X 2008 Opt. Express 16 12069
[19] Dogariu A, Xia T, Hagan D J, Said A A, Van Stryland E W and Bloembergen N 1997 J. Opt. Soc. Am. B 14 796
[20] Qu S, Zhao Ch, Zhao Q, Qiu J, Zhu C and Hirao K 2004 Opt. Lett. 29 2058
[21] Ravn J N 1992 IEEE J. Quantum Electron. 28 315
[22] Kalt H, Lyssenko V G, Renner R and Klingshirn C 1985 J. Opt. Soc. Am. B 2 1188
[23] Divakara Rao K and Sharma K K 1995 J. Opt. Soc. Am. B 12 658
[24] Si J, Qiu J, Zhai J, Shen Y and Hirao K 2002 Appl. Phys. Lett. 80 359
[25] Schneider Th, Wolfframm D, Mitzner R and Reif J 1999 Appl. Phys. B 68 749
[26] Dean D R and Collins R J 1973 J. Appl. Phys. 44 5455
[27] Wang C -R, Luo T and Lu Q -B 2008 Phys. Chem. Chem. Phys. 10 4463
[28] Chudoba C, Nibbering E T J and Elsaesser T 1998 Phys. Rev. Lett. 81 3010
[29] Conrad U, Gdde J, Jhnke V and Matthias E 1999 Appl. Phys. B 68 511
[30] Lebedev M V, Misochko O V, Dekorsy T and Georgiev N 2005 J. Exp. Theor. Phys. 100 272
[31] Liu H, Zhang H, Si J, Zhang J, Yan L, Wei X, Wen X and Hou X 2010 Opt. Commun. 283 5203
[32] Takeda J, Jinnouchi H, Kurita S, Chen Y F and Yao T 2002 Phys. Status Solidi B 229 877
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|