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Monolayer Oscillation Observed by an Oblique-Incidence Reflectance Difference Technique for the Epitaxial Growth of Oxides
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| CHEN Fan1;LÜ Hui-Bin1;ZHAO Tong1;CHEN Zheng-Hao1;YANG Guo-Zhen1;ZHU Xiang-Dong2 |
| 1Laboratory of Optical Physics, Institute of Physics and Center for Condense Matter Physics, Chinese Academy of Sciences, Beijing 100080
2Department of Physics, University of California, Davis, California 95616-8677, USA
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| Cite this article: |
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CHEN Fan, LÜ, Hui-Bin et al 2001 Chin. Phys. Lett. 18 665-667 |
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Abstract We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference (OIRD) technique on the epitaxial growth of Nb-doped SrTiO3 on SrTiO3 substrate. The periodicity was verified by the simultaneously measured reflection high-energy electron diffraction intensity oscillations. The OIRD oscillation damps during deposition, but can recover after the growth is interrupted for some time. We interpret the optical oscillations as a result of the periodic changes of the surface morphologies due to the two-dimensional layer-by-layer growth of thin films.
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| Keywords:
68.55.-a
78.20.Ci
81.15.Fg
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Published: 01 May 2001
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| PACS: |
68.55.-a
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(Thin film structure and morphology)
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78.20.Ci
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(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
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81.15.Fg
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(Pulsed laser ablation deposition)
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