Chin. Phys. Lett.  2005, Vol. 22 Issue (10): 2688-2691    DOI:
Original Articles |
Ultraviolet and Deep-Ultraviolet Emissions from c-MgxZn1-xO/MgO Ultrathin Multilayer Heterostructures
YU Ping1;QIU Dong-Jiang1,2;WU Hui-Zhen1
1Department of Physics, Zhejiang University, Hangzhou 310027 2State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027
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YU Ping, QIU Dong-Jiang, WU Hui-Zhen 2005 Chin. Phys. Lett. 22 2688-2691
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Abstract Cubic phase MgxZn1-xO/MgO multilayer heterostructures (c-MgxZn1-xO/MgO MHs) are grown on Si(100) and quartz substrates by reactive electron beam evaporation at low temperature (250°C). Cross-sectional morphology observations by field-emission scanning electron microscopy show the legible interfaces of c-MgxZn1-xO/MgO MHs. X-ray diffraction demonstrates that c-MgxZn1-xO/MgO MHs are of highly (100)-oriented. Optical transmission investigations of c-MgxZn1-xO/MgO MHs on quartz substrates reveal the coexistence of the two phases, c-MgxZn1-xO and MgO. Photoluminescence examination indicates the emergence of deep-ultraviolet emission centred at about 290nm along with the blue shift of the ultraviolet emission from 405nm to 396nm when the nominal thickness of c-MgxZn1-xO well layers of MHs is diminished to 3nm, which is probably originated from quantum confinement effect.
Keywords: 78.66.Hf      78.67.-n      79.60.Jv      81.07.-b     
Published: 01 October 2005
PACS:  78.66.Hf (II-VI semiconductors)  
  78.67.-n (Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)  
  79.60.Jv (Interfaces; heterostructures; nanostructures)  
  81.07.-b (Nanoscale materials and structures: fabrication and characterization)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2005/V22/I10/02688
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