First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy

Chin. Phys. Lett.

2003, Vol. 20

Issue (11): 1928-1931 DOI:

Original Articles

First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy

LIU Sheng¹;SUN Jia-Lin¹;SUN Hong-San²;TAN Xiao-Jing¹;SHI Shuo¹;GUO Ji-Hua¹;ZHAO Jun¹

¹Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics, Tsinghua University, Beijing 100084 ²CAAD Laboratory, Tsinghua University, Beijing 100084

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LIU Sheng, SUN Jia-Lin, SUN Hong-San et al 2003 Chin. Phys. Lett. 20 1928-1931

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Abstract The conventional 32.768 kHz tuning fork is stimulated at its first overtone resonant frequency of ～190 kHz for shear-force distance control. The time constant is measured to be 0.54 ms and it decreases about 40 times faster than that of the fundamental frequency (20.76 ms). The cross section of a corn root with height difference of ～3 μm is imaged at a scan speed of 12 μm/s for 256 x 256 pixels.

Keywords: 07.79.Fc

Published: 01 November 2003

PACS:

07.79.Fc

(Near-field scanning optical microscopes)

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y2003/V20/I11/01928

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	LIU Sheng
	SUN Jia-Lin
	SUN Hong-San
	TAN Xiao-Jing
	SHI Shuo
	GUO Ji-Hua
	ZHAO Jun

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